Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
Recent decades have witnessed rapid advancements in high-intensity laser technology. The combination of laser irradiation and ...
The industry’s response is to split compute, memory, and I/O across dies, XPU chiplets are pushing toward the reticle limit, and stitch it all together with high‑bandwidth, energy‑efficient die‑to‑die ...
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