Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

Researchers from Stony Brook University, in collaboration with Ecosuite and Ecogy Energy, have developed a self-supervised machine-learning algorithm designed to identify physical anomalies in solar ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

Not long ago, spotting an AI-generated image felt almost easy. The internet circulated a familiar checklist: count the fingers, look ...

Researchers report that the integration of machine learning and Internet of Things (IoT) technologies is enabling a new generation of intelligent industrial environments capable of real-time ...

Using a novel technique for defect detection, researchers from EPFL have settled a long-running dispute over laser additive manufacturing procedures. A graphic representation of the experimental setup ...

Hidden semiconductor defects often pass inspection but fail later in operation. Learn how latent defects form, evade ...