The ground-breaking ceremony of “Pak-Korea Testing Laboratory for PV-Modules and Allied Equipment" being established by the Pakistan Council of Renewable Energy technologies and Korea International ...
Abstract: The die-attach layer is a vulnerable structure that is important to the reliability of an insulated-gate bipolar transistor (IGBT) module. A new failure mechanism named fatigue crack network ...
Abstract: The electrification of road transport requires new inverter solutions. GaN power devices offer substantial advantages in terms of electrical performance compared to Si devices and in terms ...
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