IEEE

Defect Detection in Patterned Wafers Using Dynamic Local Adaptive Sensitivity Adjustment

Abstract: In the defect detection of patterned wafers, optical images captured by inspection systems are affected by various noises, resulting in low signal-to-noise ratios in the obtained images, ...
GitHub

A Python project for processing ADF JSON files and building hierarchical structures.

This project is designed to process Azure Data Factory (ADF) JSON files, standardize their structure, and store them as Delta files in a specified Azure Data Lake Storage account. The project is ...
Tennessean

SiC Wafer Processing Market Expansion Accelerates, Projected to Reach US$ 2,986.44 Million by 2032

The global SiC Wafer Processing market size is projected to reach US$ 2,986.44 million by 2032, at a CAGR of 14.43% during 2026–2032. PUNE, MAHARASHTRA, INDIA ...
Semiconductor Engineering

Catching Critical Defects In TSVs And Stacked Chips

Variation is becoming a bigger problem in multi-die assemblies with TSVs and hybrid bonding. Multi-modal approaches are required to test these devices. AI plays a role in improving defect capture rate ...
IEEE

Fused Silica Micro Shell Resonators by a Wafer-Level Thermal Reflow Process

Abstract: This article demonstrates a low-cost micro shell resonator forming by the wafer-level negative pressure driven reflow process. Negative pressure in the sealed mold cavity of the bonded fused ...