EDN

Why test must follow design’s example by adopting a platform-based approach

Electronics are getting more sophisticated and complex every day. Chips, boards, and the systems they comprise are increasingly difficult to design. Companies engaged in electronic product development ...
Health Affairs

Complex Clinical Laboratory Tests Can Benefit From Design Controls

Diagnostic test developers, including clinical laboratories, responded to the COVID-19 pandemic with inspiring creativity to meet patient testing needs. These developers found unique ways to enable ...
Electronic Design

ATE – Design for Test – Putting Memory to the Test in Nanometer Designs

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
EDN

Design for test boot camp, part 4: Built-in self-test

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...
Electronic Design

Transitioning from Design Validation to Production Test

Traditional electronic test methodologies often have combined different items of discrete test equipment to verify product functionality at the design stage with expensive ATE used to support volume ...