LAS VEGAS (CBSLA) — Parallel parking is getting run off the driver's test in Nevada. Nevada's DMV says it has removed parallel parking from the driver's test to save time, since most drivers pass ...

CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...

Want smarter insights in your inbox? Sign up for our weekly newsletters to get only what matters to enterprise AI, data, and security leaders. Subscribe Now Parallel Domain, a pioneer in synthetic ...

Culver City, Calif.-based Parallel Systems is testing autonomous battery-electric railcars for short-haul freight operations, and has raised $49.55 million in Series A funds to help build a fleet, ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...

Future Michigan drivers may be given an easy-out on their driver’s license test, all thanks to a new bill which would eliminate the need to demonstrate parallel parking competency. Sarah Lightner, a ...

As the transistor geometry shrinks, more transistors are packed on to a single chip, reducing manufacturing cost on a per-transistor basis. The result, however, is more transistors to test; hence, ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

To avoid database conflicts that may occur when different test cases in different parallel threads attempt to access the same database simultaneously, testing of the software application can be ...